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© 2011 by Taylor and Francis Group, LLC
CRC Press
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Library of Congress Cataloging-in-Publication Data
Pries, Kim H., 1955-
Testing complex and embedded systems / Kim H. Pries, Jon M. Quigley.
p. cm.
Summary: “Using combinatorial approaches, this book aims to motivate testers and testing
organizations to perform meaningful testing. The text details planning activities prior to
testing, how to scope the work, and how to achieve a successful conclusion. Rather than
presenting the entire continuum of testing for a particular product or design attribute,
this volume focuses on boundary conditions. The authors provide various techniques that
can be used to streamline testing and help identify problems before they occur, including
turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and
emulation”-- Provided by publisher.
Includes bibliographical references and index.
ISBN 978-1-4398-2140-4 (hardback)
1. Embedded computer systems--Testing. I. Quigley, Jon M. II. Title.
TK7895.E42P738 2010
004.16--dc22
2010043713
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© 2011 by Taylor and Francis Group, LLC

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