LeCroy_WP03_Parameter_Analysis_Package_Programming_Manual_A.pdf

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WP03 -PARAMETER ANALYSIS PACKAGE
OPERATION
AND PROGRAMMING
MANUAL
9300
SERIES
DIGITAL STORAGE OSCILLOSCOPES
LeCroy Corporation
700 Chestnut Ridge Road
Chestnut Ridge NY 10977-6499 USA
Phone: 1-800-5-LECROY 1-914-425-2000
FAX: 1-914-425-8967
www.lecroy.com
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700 Chestnut Ridge Road
Chestnut Ridge, NY 10977–6499
Tel: (914) 578 6020, Fax: (914) 578 5985
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2, rue du Pré-de-la-Fontaine
1217 Meyrin 1/Geneva, Switzerland
Tel: (41) 22 719 21 11, Fax: (41) 22 782 39 15
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www.lecroy.com
Copyright © July 1998, LeCroy. All rights reserved. Information in this publication supersedes all
earlier versions. Specifications subject to change.
LeCroy, ProBus and SMART Trigger are registered trademarks of LeCroy Corporation. Centronics is
a registered trademark of Data Computer Corp. Epson is a registered trademark of Epson America
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Inc. I C is a trademark of Philips. MathCad is a registered trademark of MATHSOFT Inc. MATLAB is
a registered trademark of The MathWorks, Inc. Microsoft, MS and Microsoft Access are registered
trademarks, and Windows and NT trademarks, of Microsoft Corporation. PowerPC is a registered
trademark of IBM Microelectronics. DeskJet, ThinkJet, QuietJet, LaserJet, PaintJet, HP 7470 and
HP 7550 are registered trademarks of Hewlett-Packard Company.
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The value of histograms in data analysis and the
interpretation of measurement results is well known. The
WP03 option added to your oscilloscope provides this and
more for waveform parameter analysis. With WP03,
histograms and trends (see
Chapter 4)
of waveform
parameter measurements can be created, statistical
parameters determined, and graphic features quantified for
analysis.
Statistical parameters alone — such as mean, standard deviation
and median — are usually insufficient for determining whether
the distribution of measured data is as expected. Histograms
provide an enhanced understanding of the distribution of
measured parameters by enabling visual assessment of the
distribution. Observations based on the histogram of a parameter
can indicate:
À
Distribution type: normal, non-normal, etc. This is helpful in
determining whether the signal behaves as expected.
À
Distribution tails and extreme values, which can be observed
and may be related to noise or other infrequent and non-
repetitive sources.
À
Multiple modes, which can be observed and could indicate
multiple frequencies or amplitudes. These can be used to
differentiate from other sources such as jitter and noise.
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Generating histograms of waveform measurement parameters is
a three-step process:
1. Waveform parameters of interest are selected from the
“CURSORS/MEASURE” menu.
2. Histograms are selected and set up through the scope’s
“Math
Setup”
menu for the waveform parameter of interest.
3. Statistical parameters are selected for measurement of
histogram characteristics.
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Histograms of user-selected waveform parameters are created
using the scope’s Histogram Math function. This is done by
defining a trace (A,
B, C,
or
D)
as a math function, and selecting
“Histogram” as the function to be applied to the trace. As with
other traces, histograms can be positioned and expanded using
the
POSITION
and
ZOOM
knobs on the instrument’s front panel.
Histograms are displayed based on a set of user settings,
including bin width and number of parameter events. Special
parameters
are
provided
for
determining
histogram
characteristics such as mean, median, standard deviation,
number of peaks and most-populated bin.
This broad range of histogram options and controls provides a
quick and easy method of analyzing and understanding
measurement results.
The “MEASURE” “Parameters” menu is accessed by pressing
the
CURSORS/MEASURE
button, then selecting “Parameters”
from the top menu that appears, as shown in
Figure 1.1.
Parameters
are used to perform waveform measurements for
the section of waveform that lies between the parameter cursors
(Annotation
➊
in this figure). The position of the parameter
cursors is set using the “from” and “to” menus and controlled by
the associated ‘menu’ knobs.
The top trace in
Figure 1.1
shows a sine waveform. A
freq
parameter measurement is being performed on the waveform
(Annotation
➋)
with a value of 202.442 kHz as the average
frequency. The bottom trace shows a histogram of the
freq
parameter with an average frequency of 201.89 kHz (Annotation
➌),
which is the average frequency of the data contained within
the parameter cursors.
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